Calibre Yield Analyzer addresses the challenge that at process nodes below half the wavelength of light, DRC verification alone is insufficient to achieve acceptable die yield. DFM (Design for Manufacturability) rules — which account for possible lithographic process variations — become increasingly important.

Calibre Yield Analyzer performs physical verification against the complete set of DFM rules and provides detailed yield impact analysis, enabling designers to prioritize and fix the most critical yield limiters.